首页 | 本学科首页   官方微博 | 高级检索  
     检索      

改进的Zernike矩工业CT图像边缘检测
引用本文:陶李,王珏,邹永宁,伍立芬,王慧倩.改进的Zernike矩工业CT图像边缘检测[J].中国光学,2012,5(1):48-56.
作者姓名:陶李  王珏  邹永宁  伍立芬  王慧倩
作者单位:重庆大学 自动化学院 光电技术及系统教育部重点实验室 ICT 研究中心,重庆 400044
基金项目:国家自然科学基金资助项目(No.60972104);中央高校基本科研业务费科研专项"研究生科技创新基金"资助项目(No.CDJXS11171159)
摘    要:为提高工业计算机断层扫描(CT)图像亚像素边缘检测的精度和速度,研究了一种改进的Zernike矩边缘检测方法。该方法采用Sobel边缘算子快速检测出图像所有可能的边缘,通过Zernike矩算子对所有可能的边缘进行重新检测,最后,检测出图像的亚像素边缘并计算其精确位置。由于采用Sobel算子检测出可能的边缘使后续Zernike矩算子检测范围缩小,从而减小了运算量,提高了运算速度。对实际CT图像进行的实验结果表明:改进的Zernike矩工业CT图像边缘检测精度绝对误差<0.24 pixel,改进算法的运算速度提高了约70%。

关 键 词:工业CT图像  图像处理  边缘检测  亚像素  Zernike矩
收稿时间:2011-09-21
修稿时间:2011-11-23

Improved Zernike moment method for industrial CT image edge detection
TAO Li,WANG Jue,ZOU Yong-ning,WU Li-fen,WANG Hui-qian.Improved Zernike moment method for industrial CT image edge detection[J].Chinese Optics,2012,5(1):48-56.
Authors:TAO Li  WANG Jue  ZOU Yong-ning  WU Li-fen  WANG Hui-qian
Institution:ICT Research Center, Key Laboratory of Optoelectronic Technology and System of the Ministry of Education, College of Automation, Chongqing University, Chongqing 400044, China
Abstract:In order to improve the detecting speed and accuracy of sub-pixel edges for an Industrial Computed Tomography(ICT) image, a kind of improved edge detecting method based on Zernike moments is studied. First, the Sobel edge operator is used to quickly detect all the possible edges of the image, and then the Zernike moment operator is taken to re-test all the possible edges. Finally, the exact positions of the sub-pixel edges can be detected and calculated. As the possible edges have been detected and the detection range is reduced, the computing amount is shortened and the operation speed is imporved. An experiment is performed on CT images, and the result shows that the absolute error for the accuracy is less than 0.24 pixel,while Zernike moment operator computing speed is increased by about 70%, which ensures the accuracy of edge detection and improves the speed of edge detection.
Keywords:industrial computed tomography image  image processing  edge detection  sub-pixel  Zernike moment
本文献已被 维普 等数据库收录!
点击此处可从《中国光学》浏览原始摘要信息
点击此处可从《中国光学》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号