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| 200 nm-1000 nm spectra of light emitted in the impact of ~(40)Ar~(10+) upon Al and Si solid surfaces | |
| 作者姓名： | 张小安 赵永涛 李福利 杨治虎 肖国青 詹文龙 |
| 作者单位： | Department of Applied Physics，Xi'an Jiaotong University，Xi'an 710049，China，Institute of Modern Physics，Chinese Academy of Sciences，Lanzhou 730000，China，Department of Applied Physics，Xi'an Jiaotong University，Xi'an 710049，China，Institute of Modern Physics，Chinese Academy of Sciences，Lanzhou 730000，China，Department of Applied Physics，Xi'an Jiaotong University，Xi'an 710049，China，Institute of Modern Physics，Chinese Academy of Sciences，Lanzhou 730000，China，Institute of Modern Physics，Chinese Academy of Sciences，Lanzhou 730000，China，Institute of Modern Physics，Chinese Academy of Sciences，Lanzhou 730000，China |
| 基金项目： | This work was supported by the National Natural Science Foundation of China (Grant Nos. 10134010, 19804012, 10274058, 10274088), |
| 摘 要： | This paper reports the measured results of the 200 nm-1000 nm characteristic spectral lines of Al, Si and Ar atoms when highly charged ions 40Ar10+ are incident upon Al and P-type Si surfaces. The ion 40Ar10+ is provided by the ECR ion source of the National Laboratory of the Heavy Ion Accelerator in Lanzhou. The results show that when the low-speed ions in the highly charged state interact with the solid surfaces, the characteristic spectral lines of the target atoms and ions spurted from the surfaces can be effectively excited. Moreover, because of the competition of the non-radiation de-excitation of the hollow atom by emitting secondary electrons with the de-excitation process by radiating photons, the spectral intensity of the characteristic spectral lines of Ar atoms on the P-type Si surface is, as a whole, greater than that of Ar atoms on the Al surface. |
200 nm-1000 nm spectra of light emitted in the impact of 40Ar10+ upon Al and Si solid surfaces |
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| ZHANG Xiao'an,ZHAO Yongtao,LI Fuli YANG Zhihu,XIAO Guoqing & ZHAN Wenlong.200 nm-1000 nm spectra of light emitted in the impact of ~(40)Ar~(10+) upon Al and Si solid surfaces[J].Science in China(Physics Astronomy),2003,46(5). | |
| Authors: | ZHANG Xiao'an ZHAO Yongtao LI Fuli YANG Zhihu XIAO Guoqing & ZHAN Wenlong |
| Institution: | 1. Department of Applied Physics, Xi'an Jiaotong University, Xi'an 710049, China;Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China 2. Department of Applied Physics, Xi'an Jiaotong University, Xi'an 710049, China 3. Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China |
| Abstract: | This paper reports the measured results of the 200 nm-1000 nm characteristic spectral lines of Al, Si and Ar atoms when highly charged ions 40Ar10+ are incident upon Al and P-type Si surfaces. The ion 40Ar10+ is provided by the ECR ion source of the National Laboratory of the Heavy Ion Accelerator in Lanzhou. The results show that when the low-speed ions in the highly charged state interact with the solid surfaces, the characteristic spectral lines of the target atoms and ions spurted from the surfaces can be effectively excited. Moreover, because of the competition of the non-radiation de-excitation of the hollow atom by emitting secondary electrons with the de-excitation process by radiating photons, the spectral intensity of the characteristic spectral lines of Ar atoms on the P-type Si surface is, as a whole, greater than that of Ar atoms on the Al surface. |
| Keywords: | highly charged ion hollow atom characteristic spectrum spectral intensity |
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