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电子束蒸发沉积Ir膜真空紫外反射特性
引用本文:干蜀毅,刘正坤,盛斌,徐向东,洪义麟,刘颍,周洪军,霍同林,付绍军.电子束蒸发沉积Ir膜真空紫外反射特性[J].光学学报,2008,28(10):2036-2040.
作者姓名:干蜀毅  刘正坤  盛斌  徐向东  洪义麟  刘颍  周洪军  霍同林  付绍军
作者单位:1. 中国科技大学国家同步辐射实验室,安徽,合肥,230029;合肥工业大学真空教研室,安徽,合肥,230009
2. 中国科技大学国家同步辐射实验室,安徽,合肥,230029
摘    要:Ir是一种重要的真空紫外反射材料,在太阳物理、宇宙物理、生命科学、大气物理、同步辐射等方面有着十分重要的应用.对电子束蒸发沉积Ir膜在真空紫外波段的反射特性进行了系统的理论和实验研究.根据吸收材料基底上单层金属膜数学计算模型,对不同基片上各种厚度的Ir膜真空紫外反射率进行了优化计算.根据计算和前期实验结果,采用电子束蒸发方法,在石英、K9玻璃基片上沉积了不同厚度的Ir膜,在入射波长120 nm处获得了近30%正入射反射率,对应的Ir膜厚度为12 nm.过厚或过薄均不利于Ir膜反射率的提高.经退火处理后,Ir膜中张应力有所释放但并未消除,同时晶粒平均尺寸显著增大,反射率下降.

关 键 词:薄膜光学  反射膜  真空紫外反射率  电子束蒸发  铱(Ir)膜
收稿时间:2008/1/28

Study on Ir Layer in Vacuum Ultraviolet Wavelength Region Deposited by Electron Gun Evaporation
Gan Shuyi,Liu Zhengkun,Sheng Bin,Xu Xiangdong,Hong Yilin,Liu Ying,Zhou Hongjun,Huo Tonglin,Fu Shaojun.Study on Ir Layer in Vacuum Ultraviolet Wavelength Region Deposited by Electron Gun Evaporation[J].Acta Optica Sinica,2008,28(10):2036-2040.
Authors:Gan Shuyi  Liu Zhengkun  Sheng Bin  Xu Xiangdong  Hong Yilin  Liu Ying  Zhou Hongjun  Huo Tonglin  Fu Shaojun
Institution:Gan Shuyi1,2 Liu Zhengkun1 Sheng Bin1 Xu Xiangdong1 Hong Yilin1 Liu Ying1Zhou Hongjun1 Huo Tonglin1 Fu Shaojun11National Synchrotron Radiation Laboratory,University of Science , Technology of China,Hefei,Anhui 230029,China2School of Mechanical , Automobile Engineering,Hefei University of Technology,Anhui 230009,China
Abstract:Ir is an important vacuum-ultraviolet(VUV) reflecting material,and has various applications in hi-tech fields including solar physics,cosmic physics,life science,and synchrotron radiation.The reflective performance of Ir film in the VUV wavelength region was studied theoretically and experimentally.Based on the theoretical model of single metal layer on absorbing substrate,the optimum calculation was performed for Ir layer of various thickness on K9 glass and quartz substrate in the VUV wavelength region.Co...
Keywords:thin film optics  reflecting layer  VUV reflectivity  electron gun evaporation (EGE)  Ir film
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