| 一种新的超分辨记录点的读出技术 |
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| 引用本文： | 魏劲松,阮昊,施宏仁,干福熹.一种新的超分辨记录点的读出技术[J].光学学报,2003,23(5):26-528. |
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| 作者姓名： | 魏劲松 阮昊 施宏仁 干福熹 |
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| 作者单位： | 中国科学院上海光学精密机械研究所,上海,201800 |
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| 基金项目： | 国家重点基础研究 973项目 ( 19990 330 )，国家 86 3计划( 2 0 0 2AA3130 30 )，国家自然科学基金重点项目 ( 5 9832 0 6 0 )，国家自然科学基金面上项目 ( 6 0 2 0 70 0 5 )资助课题。 |
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| 摘 要： | 提出一种新的超分辨记录点的读出技术—超分辨反射膜技术，详细分析了其原理。用该技术，以Sb为超分辨反射膜，SiN为介电层，在激光波长为632．8nm和光学头的数值也径为0．40的读出光学系统中实现了直径为380nm的超分辨记录点的读出。同时研究了Sb薄膜厚度对读出信噪比的影响规律，发现最佳的Sb薄膜厚度为28～30nm，所得的信噪比为38～40dB。
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| 关 键 词： | 信息处理技术 超分辨记录点 光存储 信噪比 读出技术 锑薄膜 |
| 收稿时间： | 2002/5/9 |
A Novel Approach to Super-Resolution Pits Readout |
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| Wei Jingsong,Ruan Hao,Shi Hongren,Gan Fuxi.A Novel Approach to Super-Resolution Pits Readout[J].Acta Optica Sinica,2003,23(5):26-528. |
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| Authors: | Wei Jingsong Ruan Hao Shi Hongren Gan Fuxi |
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| Abstract: | A novel approach to the super-resolution pits readout--super-resolution reflective film technique was put forward, and its principle was analyzed in detail. By using Sb as the super-resolution reflective layer and the SiN as dielectric layer, the super-resolution pits with a diameter of 380 nm were read out by the readout optics system (the laser wavelength is 632.8 nm and numerical aperture is 0.40). The influence of the Sb thin film thickness on the readout signal was investigated, the results showed that the optimum Sb thin film thickness is 28～30 nm, and the maximum signal-noise ratio is 38～40 dB. |
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| Keywords: | information processing technique super-resolution optical storage signal-noise ratio (SNR) Sb |
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