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静电放电对GaN基功率型LED老化特性的影响
引用本文:李伟国,崔碧峰,郭伟玲,崔德胜,徐昕伟.静电放电对GaN基功率型LED老化特性的影响[J].光学学报,2012,32(8):823006-217.
作者姓名:李伟国  崔碧峰  郭伟玲  崔德胜  徐昕伟
作者单位:李伟国:北京工业大学光电子技术省部共建教育部重点实验室, 北京 100124
崔碧峰:北京工业大学光电子技术省部共建教育部重点实验室, 北京 100124
郭伟玲:北京工业大学光电子技术省部共建教育部重点实验室, 北京 100124
崔德胜:北京工业大学光电子技术省部共建教育部重点实验室, 北京 100124
徐昕伟:北京工业大学光电子技术省部共建教育部重点实验室, 北京 100124
基金项目:国家863计划(2009AA03A1A3)和国家科技支撑计划(2011BAE01B14)资助课题。
摘    要:对GaN基蓝光功率型LED在老化前和老化期间施加反向人体模式静电放电(ESD),并对静电打击前后及老化前后的LED光学电学参数进行分析。实验结果及理论分析表明,ESD使LED芯片有源层及限制层中产生缺陷,最终导致电学特性及光学特性的变化。ESD给LED带来的损伤可在老化前期过程中被局部恢复,但随着老化时间推移,电参数漂移程度及光衰幅度不断增大,而老化过程中LED对ESD的敏感度增加,使LED抗ESD能力减弱。

关 键 词:光学器件  LED  氮化镓  静电放电  电流-电压特性
收稿时间:2012/2/15

Effect of Electrostatic-Discharge on the Aging Characteristics of GaN Based Power LED
Li Weiguo Cui Bifeng Guo Weiling Cui Desheng Xu Xinwei.Effect of Electrostatic-Discharge on the Aging Characteristics of GaN Based Power LED[J].Acta Optica Sinica,2012,32(8):823006-217.
Authors:Li Weiguo Cui Bifeng Guo Weiling Cui Desheng Xu Xinwei
Institution:Li Weiguo Cui Bifeng Guo Weiling Cui Desheng Xu Xinwei(Key Laboratory of Opto-Electronics Technology,Ministry of Education,Beijing University of Technology, Beijing 100124,China)
Abstract:Blue GaN-based power LEDs are biased by negative human body mode electrostatic-discharge (ESD) before and during the aging time, and the characteristics of LEDs are analyzed before and after aging experiment and ESD stress. It is found that the generation of defects in active region and cladding layers after ESD stress could finally lead to degradation of LEDs. The defects induced by ESD could be restored partly in the early aging. However, these defects can cause parameters drift more seriously. Moreover, LEDs could be more sensitive to ESD stress and have lower antistatic ability during aging.
Keywords:optical devices  LED  gallium nitride  electrostatic discharge  current-voltage characteristics
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