基准光栅重构傅里叶变换轮廓术

应用傅里叶轮廓变换术进行三维形貌测量中,为了获得待测物体的高度相位信息,通常需要采集两幅图像.因此当光学系统发牛变动时,必须重新采集基准光栅图像,不利于快速测量.提出一种从变形光栅图像中获取基准光栅图像信息的测量方法.首先在变形光栅图像中记录基准光栅信息,然后通过傅里叶分析提取基准光栅频率信息,通过图像分析获得基准光栅相位信息,最后重构出一幅完整的基准光栅图像,实现三维物体形貌测量.实验结果验证了该方法的可行的.

Fourier Transform Profilometry by Original Grating Reconstruction from Deformed Grating Pattern

In Fourier transform profilometry (FTP) for three-dimensional (3-D) shape measurement, in order to obtain the height and phase information of a testing object, two images are needed, i.e. original grating pattern and its deformed grating pattern. Therefore, if the optical system is changed, it is necessary to obtain a new original grating pattern. Such arrangement does harm to fast measurement. For overcoming the shortage, a new method is proposed for obtaining the information of the original grating pattern from its deformed grating pattern. First the information of the original grating pattern is recorded in its deformed grating image. Then its frequency and phase are obtained from the deformed grating image by means of image analysis. Finally the complete original grating image is reconstructed and 3-D shape measurement is relized. The experimental results show that the above method is available.