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利用P—偏振光双面反射法测量多层膜的光学参数
引用本文:刘晓林,梁培辉.利用P—偏振光双面反射法测量多层膜的光学参数[J].光学学报,1998,18(5):07-611.
作者姓名:刘晓林  梁培辉
作者单位:中国科学院上海光学精密机械研究所
摘    要:利用P-偏振光双面反射法测量了浸泡提拉法制备了“有机硅树脂-二氧化硅-有机硅树脂”三层膜样品两面P-偏振光反射强比γ与入射角θ关系曲线,经过数据拟合,确定了这三层薄膜的光学参数,同时研究了薄膜间的相互作用层的光学参数,测量结果表明此方法可能成为研究薄膜和膜层之间的相互作用的一种新手段。

关 键 词:P-偏振光  多层膜系  光学参数  双面反射法
收稿时间:1997/3/20

Measurement of the Parameters of Multi Layer Coating by P Polarized Reflectances
Liu Xiaolin,Liang Peihui,Zhang Weiqing,Tang Yongxing,Sun Jinren.Measurement of the Parameters of Multi Layer Coating by P Polarized Reflectances[J].Acta Optica Sinica,1998,18(5):07-611.
Authors:Liu Xiaolin  Liang Peihui  Zhang Weiqing  Tang Yongxing  Sun Jinren
Abstract:Using the P polarized reflectances, we measured the incidence angle versus the reflectance ratio γ of a three layer coating (such as “organic silicon resin SiO 2 organic silicon resin”) formed by dip coating. The optical parameters of those layers of the coating were obtained by means of data fitting. At the same time, the optical parameters of the interfaces between two coatings were investigated.
Keywords:P  polarized light    reflectanc ratio    multi  layer film    optical parameters    
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