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用低精度CCD获得高精度测量方法的研究
引用本文:王和顺,陈次昌,黄惟公.用低精度CCD获得高精度测量方法的研究[J].光学学报,2005,25(11):488-1492.
作者姓名:王和顺  陈次昌  黄惟公
作者单位:西华大学机械工程与自动化学院,成都,610039;西南交通大学机械工程学院,成都,610031;西华大学机械工程与自动化学院,成都,610039
基金项目:国家自然科学基金(90410013)资助课题.
摘    要:为了大幅提高线阵CCD的测量精度,提出了一种全新的CCD使用方法。该方法是将N个像元间距为H的线阵CCD器件许排组合住一起,并沿像元线性分布方向以距离为H/N依次均匀错开排列。多个线阵CCD的感光电信号经多通道模一数同步采集,保存到存储器中指定位置。然后,通过对所有CCD测量数据的分析计算来获得精确的测量值。分别采用单CCD和双CCD错排对长为30mm,直径为5.000mm、8.000mm、12.000mm的三个标准杆件的直径进行了测量。结果表明,蚁CCD错排可获得两倍于单CCD的测量精度。该方法可从理论上彻底打破CCD像元问距的限制,并使线阵CCD的测量精度大幅度地提高。

关 键 词:测量  CCD像素错排  非接触式测量  像元间距
文章编号:0253-2239(2005)11-1488-5
收稿时间:2004-10-11
修稿时间:2005-03-08

Research on the Method of High Accuracy Measurement by Use of Low Accuracy CCD
Wang Heshun,Chen Cichang,Huang Weigong.Research on the Method of High Accuracy Measurement by Use of Low Accuracy CCD[J].Acta Optica Sinica,2005,25(11):488-1492.
Authors:Wang Heshun  Chen Cichang  Huang Weigong
Institution:1.School of Mechanical Engineering and Automation, Xihua University, Chengdu 610039 ;2.School of Mechanical Engineering, Southwest Jiaotong University, Chengdu 610031
Abstract:\ For higher measurement accuracy of linear charge coupled device CCD,a new method of using CCD was proposed.Several linear CCDs were fit together,and staggered by the distance of H/N,H was space between pixels,N was CCD amount.The photo electric signals were collected in-phase by multicenter A/D,and saved in memorizer.Then accurate value was obtained through analyzing all these data.Diameters of 5.000 mm,8.000 mm and 12.000 mm of three standard poles were measured by single CCD and two staggered CCD with 30 mm stagger long.The result showed that accuracy using two staggered CCD was twice as high as that using single CCD.The method could avoid space between pixels astriction theoretically,so higher measurement accuracy was gained.
Keywords:measurement  CCD image stagger  noncontacting measurement  image space-between
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