Analysis of laser scribes at CIGS thin-film solar cells by localized electrical and optical measurements

Laser patterning of thin-film solar cells is essential to perform external serial and integrated monolithic interconnections for module application and has recently received increasing attention. Current investigations show, however, that the efficiency of thin-film Cu(In,Ga)Se₂ (CIGS) modules is reduced due to laser scribing also with ultrashort laser pulses. Hence, to investigate the reasons of the laser-induced material modifications, thin-film CIGS solar cells were laser-scribed with femto- and picosecond laser pulses using different scribing procedures and laser processing parameters. Besides standard electrical current voltage (I–V) measurements, additional electrical and optical analysis were performed such as laser beam-induced current (LBIC), dark lock-in thermography (DLIT), and electroluminescence (EL) measurements to characterize and localize electrical losses due to material removal/modifications at the scribes that effecting the electrical solar cell properties. Both localized as well as distributed shunts were found at laser scribe edges whereas the laser spot intensity distribution affecting the shunt formation. Already laser irradiation below the ablation threshold of the TCO film causes material modification inside the thin film solar cell stack resulting in shunt formation as a result of materials melting near the TCO/CIGS interface that probably induces the damage of the pn-junction.