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Zno-SiO2-Si结构中压电薄膜C轴取向等参数对声表面波的影响
引用本文:邓明晰.Zno-SiO2-Si结构中压电薄膜C轴取向等参数对声表面波的影响[J].应用声学,1997,16(2):18-23.
作者姓名:邓明晰
作者单位:重庆后勤工程学院物理教研室!重庆,630042
摘    要:当ZnO-SiO2-Si结构中的ZnO薄膜C轴取向偏离基片法向时,将对声表面波传播速度,机电耦合系数等参量产生影响。本文对此问题进行了理论分析和数值计算;同时还讨论了本结构中影响声表面波束偏的一些参数。

关 键 词:C轴取向  声表面波  束偏  压电薄膜

The effects of the c-axis orientation of the ZnO film and other parameters in ZnO-SiO2-Si layered structure on SAW
Deng Mingxi.The effects of the c-axis orientation of the ZnO film and other parameters in ZnO-SiO2-Si layered structure on SAW[J].Applied Acoustics,1997,16(2):18-23.
Authors:Deng Mingxi
Institution:Logistical Engineering University , Chongqing , 630042
Abstract:The important parameters of SAW devices, the SAW velocity and the me chanico-electrical coupling coefficient, will be affected by the c-axis orientation of ZnO film in a ZnO-SiO2-Si layered structure. In the present paper, the problem is studied the oretically. Moreover, beamsteering of SAW is also investigated for the layered structure.
Keywords:ZnO film  C-axis orientation  Surface acoustic wave  Beamsteering
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