一种嵌入式软件逻辑覆盖测试方法研究

针对嵌入式软件测试覆盖率低的问题，本文提出了基于软件故障注入的逻辑覆盖测试方法，首先就嵌入式系统常用传感器建立故障模式库，设计了嵌入式软件故障注入系统；其次选取中间层作为故障注入点，研究基于VxWorks653嵌入式操作系统的故障注入实现方式，并通过分析故障信号在软件系统中的传播，提出优化测试用例的方法；最后通过实验验证了该方法可有效提高容错设计功能、冗余设计功能、故障检测功能测试的逻辑覆盖率；有助于提高嵌入式软件的可靠性。

A Logic Coverage Test Method Research for Embedded Software

In order to solve the low rate logic coverage on embedded software, this paper based on the software fault injection technique puts forward the logic coverage testing method. Firstly, the fault mode library for commonly used sensors of the embedded system was established, and then the embedded software fault injection system was designed. Secondly, intermediate layer was chosen as the fault injection point, and the realization of fault injection for VxWorks653 embedded operating system was studied. Through analyzing the propagation of fault signal in software system, an optimization method of fault injection case was present. Finally, an experiment verified that this method can improve the logic coverage rate for the functions of fault-tolerant design, redundancy design and fault detection. This method is also helpful to improve the reliability of the embedded software.