首页 | 本学科首页   官方微博 | 高级检索  
     检索      

宣德官窑青花瓷的面扫描分析
引用本文:杨益民,冯敏,朱剑,毛振伟,王昌燧,黄宇营,何伟.宣德官窑青花瓷的面扫描分析[J].光谱学与光谱分析,2004,24(8):902-906.
作者姓名:杨益民  冯敏  朱剑  毛振伟  王昌燧  黄宇营  何伟
作者单位:1. 中国科学技术大学科技史与科技考古系,安徽 合肥 230026
2. 中国科学院高能物理研究所,北京 100039
基金项目:中国科学院创新工程 (KJCX No4),国家自然科学重点基金 (1 0 1 350 50 )资助项目
摘    要:用SRXRF对宣德时期官窑青花瓷片上的瓷彩进行面扫描分析,结果表明各元素分析线的峰面积有着不同的分布模式。根据与颜色浓淡、瓷彩上黄斑的耦合关系可以将K,Cr,Mn,Fe,Co,Ni,Cu,Zn,Hg,Rb,Sr,Y和Zr等13个元素分为3组。它可作为各个朝代青花瓷“指纹元素”的选择依据,并提出了研究瓷彩中黄斑的形成机制的新思路。

关 键 词:青花瓷  SRXRF  面扫描  无损检测  
文章编号:1000-0593(2004)08-0902-05
收稿时间:2002-11-16
修稿时间:2002年11月16

Plane Scan Analysis of the Surface of White and Blue Porcelain by SRXRF Method
YANG Yi min ,FENG Min ,ZHU Jian ,MAO Zhen wei ,WANG Chang sui ,HUANG Yu ying ,HE Wei.Plane Scan Analysis of the Surface of White and Blue Porcelain by SRXRF Method[J].Spectroscopy and Spectral Analysis,2004,24(8):902-906.
Authors:YANG Yi min  FENG Min  ZHU Jian  MAO Zhen wei  WANG Chang sui  HUANG Yu ying  HE Wei
Institution:1. Department of Science and Technology Archaeology, University of Science and Technology of China,Hefei 230026,China2. Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100039,China
Abstract:In this article, the authors analyze the surface of a piece of porcelain shred in Xuande Period by SRXRF, and the result shows that each peak area of elements differs in distribution pattern. According to the relationship between element peak area and color variation, and yellow fleck in glaze, it is possible to divide 13 elements, i.e. K, Cr, Mn, Fe, Co, Ni, Cu, Zn, Hg, Rb, Sr, Y and Zr, into three groups. This phenomenon will indicate how to search the "finger elements" in each dynasty; at the same time, it will present important information for research on the forming mechanism of yellow flecks in glaze.
Keywords:White and blue porcelain  SRXRF  Plane scan analysis  Non-destructive identification
本文献已被 CNKI 维普 万方数据 等数据库收录!
点击此处可从《光谱学与光谱分析》浏览原始摘要信息
点击此处可从《光谱学与光谱分析》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号