首页 | 本学科首页   官方微博 | 高级检索  
     检索      

基于全反射原理的X荧光分析技术及其应用研究
引用本文:田宇.基于全反射原理的X荧光分析技术及其应用研究[J].光谱学与光谱分析,1999,19(3):430-433.
作者姓名:田宇
作者单位:烟台大学物理系,264005,烟台
摘    要:本文简单介绍了一种目前我国应用很少但很有竞争力的新兴元素分析方法——全反射X荧光(TXRF)分析技术,我们自行研制的分析装置的最低检测限,对于Cu靶、Mo靶达到pg级,其相对检测限达到ng/g。作为应用范例,还叙述了一种海洋软体动物“牙齿”的定量分析,并给出了相应的X荧光谱图和分析结果。

关 键 词:全反射X荧光分析  pg级检测限  多元素同时分析

TXRF Technique and Quantitative Analysis of Mollusc Teeth
Yuhong TIAN,Kai LIU,Xuran WU,Suhua ZHENG.TXRF Technique and Quantitative Analysis of Mollusc Teeth[J].Spectroscopy and Spectral Analysis,1999,19(3):430-433.
Authors:Yuhong TIAN  Kai LIU  Xuran WU  Suhua ZHENG
Institution:Department of physics, Yantai University, 264005 Yantai.
Abstract:Total reflection X ray fluorescence(TXRF)analysis technique and the instrument with a short path,high efficiency,low power and small volume are briefly presented.The detection limit of the system are at pg level for Cu and Mo target excition.Teeth of a marine mollusc were measured quantitatively and the spectrum and analysis results were given.
Keywords:Total reflection X  ray fluorescence    pg  level detection limits    Multi  element simultaneous analysis
本文献已被 CNKI 维普 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号