首页 | 本学科首页   官方微博 | 高级检索  
     检索      

基于飞秒激光引导高压放电的SF6分解物原位检测
引用本文:张云刚,刘黄韬,高强,朱志峰,李博,王永达.基于飞秒激光引导高压放电的SF6分解物原位检测[J].光谱学与光谱分析,2021,41(2):414-418.
作者姓名:张云刚  刘黄韬  高强  朱志峰  李博  王永达
作者单位:1. 燕山大学电气工程学院,河北 秦皇岛 066004
2. 天津大学内燃机燃烧学国家重点实验室,天津 300072
基金项目:国家自然科学基金项目(51806149,61308065);河北省自然科学基金项目(E2015203014)资助。
摘    要:气体绝缘开关设备(GIS)绝缘缺陷引发的放电会导致SF6分解,分解产生的低氟硫化物与设备内的微量H2O和O2反应生成具有腐蚀性的物质,影响设备正常运行,因此,研究SF6分解机理对GIS的安全运行具有重要意义。由于部分分解物在采样过程中发生转化,因此,实现SF6分解物的原位检测对于研究SF6分解机理是十分必要的。采用飞秒激光引导高压放电实现了高压放电空间和时间的精确控制,并利用飞秒激光引导高压放电产生的空间分辨光谱实现了SF6分解物的原位测量。首先研究证明了飞秒激光不会引起SF6的分解;其次,利用飞秒激光产生的等离子体通道实现了放电空间和时间的精确控制;最后,发现分解物中包含由于高能电子碰撞直接或间接产生的大量S和F的离子和原子。研究证明了基于飞秒激光引导高压放电可以实现SF6分解物的原位检测,为开展高压放电下SF6分解机理研究提供了一种新的研究手段。

关 键 词:飞秒激光引导高压放电  原位检测  空间分辨光谱  SF6  
收稿时间:2020-01-04

In-Situ Detection of SF6 Decomposition Products Based on Femtosecond Laser-Guided High-Voltage Discharge
ZHANG Yun-gang,LIU Huang-tao,GAO Qiang,ZHU Zhi-feng,LI Bo,WANG Yong-da.In-Situ Detection of SF6 Decomposition Products Based on Femtosecond Laser-Guided High-Voltage Discharge[J].Spectroscopy and Spectral Analysis,2021,41(2):414-418.
Authors:ZHANG Yun-gang  LIU Huang-tao  GAO Qiang  ZHU Zhi-feng  LI Bo  WANG Yong-da
Institution:1. School of Electrical Engineering, Yanshan University, Qinhuangdao 066004, China 2. State Key Laboratory of Engines, Tianjin University, Tianjin 300072, China
Abstract:The occurrence of discharge due to insulation defects in gas insulated switchgear(GIS)can cause decomposition of SF6.The low-fluoride sulfide species produced by the decomposition react with trace amounts of H2O and O2 in the equipment to produce corrosive substances,which affect the normal operation of the equipment.Thus,it is of great significance to study the decomposition mechanism for the safe operation of GIS.Some decomposition products are transformed in the process of sampling.Hence,it is necessary to realize the in-situ detection of SF6 decomposition products to study the mechanism of SF6 decomposition.Femtosecond laser-guided high-voltage discharge technology was proposed to achieve the precise control of the space and time of high-voltage discharge,and the in-situ measurement of SF6 decomposition products was achieved by using space-resolved spectrum generated by femto second laser-guided high-voltage discharge in our work.In this paper,firstly,the decomposition of SF6 is not caused by femtosecond laser.Secondly,the precise control of discharge space and time is achieved by using the plasma channel generated by femtosecond laser.Finally,it is found that the decomposition contains a large number of S and F ions and atoms that are directly or indirectly generated by high-energy electron collisions.The research proves that in-situ detection of SF6 decomposition products can be achieved based on femtosecond laser-guided high-voltage discharge,which provides a new research method for the study of SF6 decomposition mechanism under high-voltage discharge.
Keywords:Femtosecond laser-guided high-voltage discharge  In-situ detection  Spatially resolved spectrum  SF6
本文献已被 CNKI 维普 等数据库收录!
点击此处可从《光谱学与光谱分析》浏览原始摘要信息
点击此处可从《光谱学与光谱分析》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号