| Si（Li）谱仪测定X射线荧光谱中CrKβ谱线化学位移的探索 |
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| 引用本文： | 彭良强,魏成连.Si（Li）谱仪测定X射线荧光谱中CrKβ谱线化学位移的探索[J].光谱学与光谱分析,1998,18(1):98-100. |
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| 作者姓名： | 彭良强 魏成连 |
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| 作者单位： | 中国科学院高能物理研究所 |
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| 摘 要： | 采用放射源＾２４１Ａｍ５９．６ｋｅＶγ射线分别激发金属Ｃｒ、Ｃｒ２Ｏ３和Ｋ２ＣｒＯ４，用Ｓｉ（Ｌｉ）谱仪比较测量其Ｋｘ射线的能量。实验表明Ｋ２ＣｒＯ４和ＣｒＫβ能峰相对于金属Ｃｒ有２．１２±０．２７ｅＶ的位移。
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| 关 键 词： | 化学位移 X射线荧光 CrKβ谱线 铬 |
Chemical shifts of CrKbeta peaks in XRF spectra by Si(Li) spectrometry] |
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| L Peng,C Wei,Y Liu,T Zhang,Q Wu.Chemical shifts of CrKbeta peaks in XRF spectra by Si(Li) spectrometry][J].Spectroscopy and Spectral Analysis,1998,18(1):98-100. |
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| Authors: | L Peng C Wei Y Liu T Zhang Q Wu |
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| Institution: | Institute of High Energy Physics, Academia Sinica, 100080 Beijing. |
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| Abstract: | The energies of CrKbeta X-Rays in metel Cr, Cr2Os and K2CrO4, which are excited respectively by gamma-ray 59.6keV from radioactive source 241Am, have been measured by Si(Li) spectrometry. It is shown in the experiment that the peak of CrKbeta X-ray in K2CrO4 shifts 2.12 +/- 0.27eV compared to that in metel Cr. |
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