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| PTCDA/ITO表面和界面的X射线光电子能谱分析 | |
| 引用本文： | 欧谷平,宋珍,桂文明,张福甲.PTCDA/ITO表面和界面的X射线光电子能谱分析[J].光谱学与光谱分析,2006,26(4):753-756. |
| 作者姓名： | 欧谷平 宋珍 桂文明 张福甲 |
| 作者单位： | 1. 兰州大学物理科学与技术学院,甘肃,兰州,730000;湖南科技大学物理学院,湖南,湘潭,411201 2. 北京机械工业学院基础部,北京,100085 3. 兰州大学物理科学与技术学院,甘肃,兰州,730000 |
| 基金项目： | 中国科学院资助项目 , 国家自然科学基金 |
| 摘 要： | 利用X射线光电子能谱对PTCDA/p-Si有机/无机光电探测器中PTCDA/ITO表面和界面进行了测试分析. 结果表明, 苝环上的C原子的结合能为284.6 eV, 酸酐中的C原子的结合能为288.7 eV, 并存在来源于ITO膜中的氧对C原子的氧化现象, 界面处C(1s)谱中较高结合能峰消失, 且峰值向低结合能发生化学位移;CO键中O原子的结合能为531.5 eV, C-O-C键中的O原子的结合能为533.4 eV. |
| 关 键 词： | 表面及界面 X光电子能谱(XPS) PTCDA/ITO |
| 文章编号： | 1000-0593（2006）04-0753-04 |
| 收稿时间： | 2004-12-18 |
| 修稿时间： | 2005-05-26 |
Surface and Interface Analysis of PTCDA/ITO Using X-Ray Photoelectron Spectroscopy (XPS) |
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| OU Gu-ping,SONG Zhen,GUI Wen-ming,ZHANG Fu-jia.Surface and Interface Analysis of PTCDA/ITO Using X-Ray Photoelectron Spectroscopy (XPS)[J].Spectroscopy and Spectral Analysis,2006,26(4):753-756. | |
| Authors: | OU Gu-ping SONG Zhen GUI Wen-ming ZHANG Fu-jia |
| Institution: | 1. School of Physical Science and Technology, Lanzhou University, Lanzhou 730000, China ;2. School of Physics, Hunan University of Science and Technology, Xiangtan 411201, China; 3. School of Basic Courses, Beijing Institute of Machinery, Beijing 100085, China |
| Abstract: | X-ray photoelectron spectroscopy (XPS) of surface and interface of PTCDA/ITO in PTCDA/p-Si organic-on-inorganic photoelectric detector was investigated. From C1s fine spectrum we found that the binding energy of C atoms in perylene rings was 284.6 eV; and the binding energy of C atoms in acid radical was 288.7 eV; moreover, some C atoms were oxidized by O atoms from ITO. The binding energy of O atoms in C=O bonds and C-O-C bonds was 531.5 and 533.4 eV, respectively. At the interface, the peak of high binding energy in C1s spectrum disappeared, and the main peak shifted toward lower binding energy. |
| Keywords: | Surface and interface X-ray photoelectron spectroscopy(XPS) PTCDA/ITO |
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