| 有机锡化合物的光电子能谱和质谱研究Ⅲ |
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| 引用本文： | 李兴林,何晓智.有机锡化合物的光电子能谱和质谱研究Ⅲ[J].光谱学与光谱分析,1999,19(2):142-144. |
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| 作者姓名： | 李兴林 何晓智 |
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| 作者单位： | 1. 中国科学院长春应用化学研究所,130022,长春
2. 东北师范大学化学系,130022,长春 |
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| 摘 要： | 本文利用光电子能谱（ＸＰＳ）和质谱（ＭＳ）研究了１２种有机锡化合物。通过ＸＰＳ和ＭＳ讨论了化合物中取代基对锡内层电子的影响及对ＳｎＯ键的影响。结果表明ＸＰＳ和ＭＳ对有机锡化合物某些化学键性质的讨论具有互补性。
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| 关 键 词： | 结合能 电子云 |
X-Ray Photoelectron Spectroscopy and Mass Spectrum of Organic Tin Compounds |
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| Xinglin LI,Xiaozhi HE.X-Ray Photoelectron Spectroscopy and Mass Spectrum of Organic Tin Compounds[J].Spectroscopy and Spectral Analysis,1999,19(2):142-144. |
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| Authors: | Xinglin LI Xiaozhi HE |
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| Institution: | Changchun Institute of Applied Chemistry, Academia Sinica, 130022 Changchun. |
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| Abstract: | The relationship between the chemical displacement of the binding energy and the different chemical environment for 12 organic tin compounds was studied by means of X ray photoelectron spectronscopy.The different substituents in the compounds have influence on the tin outer electron and Sn O bond,which was discussed by X ray photoelectron spectroscopy and mass spectrum. |
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| Keywords: | XPS MS |
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