| Sn-C60薄膜的紫外吸收光谱和X-射线衍射谱分析 |
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| 引用本文： | 伍春燕,钟韶,陈易明,张海燕,何艳阳,朱燕娟.Sn-C60薄膜的紫外吸收光谱和X-射线衍射谱分析[J].光谱学与光谱分析,2002,22(3):495-497. |
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| 作者姓名： | 伍春燕 钟韶 陈易明 张海燕 何艳阳 朱燕娟 |
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| 作者单位： | 广东工业大学应用物理系,广东,广州,510090 |
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| 基金项目： | 广东省自然科学基金资助项目 (No 980 4 1 9) |
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| 摘 要： | 对Sn-C60薄膜进行紫外可见光吸收，X-射线衍射和扫描电镜的测定结果显示，薄膜样品紫外可见光吸收的两个短波段吸收峰比纯C60薄膜的吸收峰显著下降，说明Sn-C60薄膜的电子光吸收跃迁为间接跃迁，能带中有杂质能级的存在；样品的X射线衍射峰则对应于面心立方结构；扫描电镜结果显示薄膜为纳米级颗粒组成。
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| 关 键 词： | Sn－C60薄膜 紫外可见吸收光谱 电子跃迁 X－射线衍射 富勒烯 碳60 锡 掺杂 测量 |
| 文章编号： | 1000-0593(2002)03-0495-03 |
| 修稿时间： | 2001年7月6日 |
The Analysis of UV Absorption Spectrum and X-ray Diffraction Spectrum of Sn-doped C60 Thin Films |
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| WU Chun yan,ZHONG Shao,CHEN Yi ming,ZHANG Hai yan,HE Yan yang,and ZHU Yan juan.The Analysis of UV Absorption Spectrum and X-ray Diffraction Spectrum of Sn-doped C60 Thin Films[J].Spectroscopy and Spectral Analysis,2002,22(3):495-497. |
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| Authors: | WU Chun yan ZHONG Shao CHEN Yi ming ZHANG Hai yan HE Yan yang and ZHU Yan juan |
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| Institution: | Department of Physics, Guangdong University of Technology, Guangzhou 510090, China. |
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| Abstract: | In this article, We report our measured results of UV Vis absorption, X ray diffraction and scanning electron microscope for Sn doped C 60 thin film. The results show the two absorption peaks in respective short wave range of UV absorption have an apparent decline after doping Sn, and the position of three absorption peaks have a slightly shift respectively to red wave direction.The electron absorption transition of Sn C 60 film is indirect transition, and there are impurity levels in the energy band; X ray diffraction shows that the crystal structure of Sn C 60 film is f.c.c.The film is in the form of tiny drops in nano magnitude. |
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| Keywords: | UV Vis absorption spectrum Electron absorption transition X ray diffraction |
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