| 激光等离子体软X射线光源光谱强度测量方法 |
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| 引用本文： | 尼启良,巩岩,陈波,曹健林.激光等离子体软X射线光源光谱强度测量方法[J].光谱学与光谱分析,2004,24(1):1-3. |
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| 作者姓名： | 尼启良 巩岩 陈波 曹健林 |
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| 作者单位： | 中国科学院长春光学精密机械与物理研究所应用光学国家重点实验室,吉林,长春,130022;中国科学院长春光学精密机械与物理研究所应用光学国家重点实验室,吉林,长春,130022;中国科学院长春光学精密机械与物理研究所应用光学国家重点实验室,吉林,长春,130022;中国科学院长春光学精密机械与物理研究所应用光学国家重点实验室,吉林,长春,130022 |
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| 基金项目： | 国家自然基金(10333010)资助项目 |
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| 摘 要： | 提出了一种新的探测和测量激光等离子体软X射线源光谱强度的方法。该方法使用通道电子倍增器和定标过的硅光电二极管为探测器 ,前者是非标准探测器 ,后者为标准探测器。应用电荷灵敏前置放大器测量探测器产生的电量 ,并以高分辨率的光谱仪为分光元件 ,在已知光栅效率、通道电子倍增器增益、硅光电二极管能量响应的条件下 ,给出了计算激光等离子体软X射线源在某一波长光谱强度的公式
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| 关 键 词： | 软X射线源 激光等离子体 光谱强度 |
| 文章编号： | 1000-0593(2004)01-0001-03 |
| 修稿时间： | 2002年8月15日 |
Method to Measure Spectrum Intensity from Laser Plasma Soft X-ray Source |
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| Qi-liang Ni,Yan Gong,Bo Chen,Jian-lin Cao.Method to Measure Spectrum Intensity from Laser Plasma Soft X-ray Source[J].Spectroscopy and Spectral Analysis,2004,24(1):1-3. |
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| Authors: | Qi-liang Ni Yan Gong Bo Chen Jian-lin Cao |
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| Institution: | State Key Lab of Applied Optics, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130022, China. |
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| Abstract: | This paper presents a method to detect and measure spectrum intensity from a laser plasma soft X-ray source. A Channel Electron Multiplier (CEM) and a caliberated silicon photodiode were used as detectors in this method, the former is a nonstandard detector and the latter is a standard one. Charge-sensitive preamplifiers were used for measuring total charges generated by detectors, and a monochromator with high resolution was employed as the spectrometer. The formulae to calculate spectrum intensity from laser plasma soft X-ray source was given, based on the known grating efficiency of the monochromator, CEM's gain and responsivity of the silicon photodiode to photons. |
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| Keywords: | Soft X-ray source Laser plasma Spectrum intensity |
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