| 扫描隧道显微镜对不同样品测试条件的分析 |
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| 引用本文： | 冯璐.扫描隧道显微镜对不同样品测试条件的分析[J].大学物理实验,2008,22(2):1-3. |
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| 作者姓名： | 冯璐 |
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| 作者单位： | 北京理工大学,北京,100081 |
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| 摘 要： | 概述了扫描隧道显微镜（STM）的应用，讨论了扫描隧道显微镜（STM）对不同样品测试的条件，这对STM图象的分析有着重要的作用。
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| 关 键 词： | 隧道扫描显微镜(STM) 样品 测试条件 |
APPLICATION OF SCANNING TUNNELING MICROSCOPY AND DISCUSSION THE TEST CONDITIONS OF DIFFERENT SPECIMEN WITH STM |
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| Feng Lu.APPLICATION OF SCANNING TUNNELING MICROSCOPY AND DISCUSSION THE TEST CONDITIONS OF DIFFERENT SPECIMEN WITH STM[J].Physical Experiment of College,2008,22(2):1-3. |
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| Authors: | Feng Lu |
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| Institution: | Feng Lu(Beijing University of Science , Technology,Beijing,100081) |
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| Abstract: | The main applications of STM are briefly introduced.The test conditions of different specimen with STM are discussed. |
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| Keywords: | scanning tunneling microscope(STM) specimen test conditions |
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