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不同厚度像素CdZnTe探测器的性能测试和评估
引用本文:沈敏,肖沙里,张流强,曹玉琳,陈宇晓.不同厚度像素CdZnTe探测器的性能测试和评估[J].强激光与粒子束,2014,26(3):034001-215.
作者姓名:沈敏  肖沙里  张流强  曹玉琳  陈宇晓
作者单位:1.重庆大学 光电技术及系统教育部重点实验室, 重庆 400030;
基金项目:国家自然科学基金项目(10876044/A06)
摘    要:碲锌镉材料(CdZnTe)是目前探测X射线和γ射线的最好材料之一。将241 Am和137 Cs辐射源作用于像素CdZnTe探测器,通过实验和仿真分别得到能量谱估计、能量分辨率和峰值效率。由实验和仿真结果得出:在662keV的高能量下,厚度较大的CdZnTe探测器可获得更高的能量分辨率和峰值效率,但在59.5keV低能处会出现拖尾升高和电荷损失的现象;厚度较薄的探测器在低能处的特性反而更好。

关 键 词:碲锌镉    探测器    能量谱    能量分辨率    峰值效率
收稿时间:2013/6/8

Experiment and simulation of performance characteristics for pixellated CdZnTe detectors with various thickness
Institution:1.Key Laboratory of Optoelectronic Technology and Systems Chongqing University,Ministry of Education,Chongqing 400030,China;2.Institute of Electronic Engineering,CAEP,Mianyang 621900,China;3.Chongqing Technology and Business Institute,Hechuan 401520,China
Abstract:Cadmium zinc telluride (CZT) is one of the preferred materials for the fabrication of X-ray and gamma-ray detector. The purpose of this work was to evaluate limitations of pixellated CdZnTe detectors thickness used under different photon energy and find the best possible compromise for different detector thicknesses. Simulations and experimental investigations of the energy spectrum, energy resolution and photopeak efficiency measured by pixellated CdZnTe detectors have been performed using 241Am and 137Cs irradiation sources. It is concluded that thick CdZnTe provides high energy resolution and photopeak efficiency for high energy of 662 keV, but it suffers from increased tailing and charge loss for low energy of 59.5 keV; while thin devices can provide better performance.
Keywords:cadmium zinc telluride  detectors  energy spectrum  energy resolution  photopeak efficiency
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