首页 | 本学科首页   官方微博 | 高级检索  
     检索      

硬X光光电成像系统面密度分辨能力
引用本文:叶雁,祁双喜,李泽仁,朱鹏飞,钱伟新,刘振清,钟杰,李作友,李军,罗振雄,朱巍.硬X光光电成像系统面密度分辨能力[J].强激光与粒子束,2009,21(10).
作者姓名:叶雁  祁双喜  李泽仁  朱鹏飞  钱伟新  刘振清  钟杰  李作友  李军  罗振雄  朱巍
作者单位:中国工程物理研究院 流体物理研究所, 四川 绵阳 621900
基金项目:国防科技基础研究基金 
摘    要: 针对基于将X光转换成可见光接收的硬X光光电成像系统,研究了系统面密度分辨能力的理论模型,获得了系统面密度分辨能力的上下限的表达式;建立了对硬X光成像系统对面密度分辨能力的测量方法。利用自制面密度分辨率板,实验测量了由射频X光机、转换屏、光纤锥耦合和CCD相机组成的硬X光光电成像系统在不同照射量下的面密度极限分辨能力的上下限值。实验结果与理论分析模型分析趋势一致,在未饱和条件下面密度分辨力上限随着照射量的增加而不断增加,而面密度分辨力下限随着照射量的增加将减小。

关 键 词:硬X光  成像系统  面密度  照射量  转换屏
收稿时间:1900-01-01;

Areal density resolution in hard X-ray digital imaging system
Ye Yan,Qi Shuangxi,Li Zeren,Zhu Pengfei,Qian Weixin,Liu Zhenqing,Zhong Jie,Li Zuoyou,Li Jun,Luo Zhenxiong,Zhu Wei.Areal density resolution in hard X-ray digital imaging system[J].High Power Laser and Particle Beams,2009,21(10).
Authors:Ye Yan  Qi Shuangxi  Li Zeren  Zhu Pengfei  Qian Weixin  Liu Zhenqing  Zhong Jie  Li Zuoyou  Li Jun  Luo Zhenxiong  Zhu Wei
Institution:Institute of Fluid Physics, CAEP, P. O. Box 919-109, Mianyang 621900, China
Abstract:Hard X-ray radiography is a technique widely used to diagnose inner information of matters. It is necessary to study the areal density(AD) resolution of hard X-ray imaging systems, because areal density is an important measurement of density, thickness and quality. In this paper, the model of AD resolution is derived and a new method of measurement for AD resolution is established. Using the self-made AD resolution plate, AD resolution limit of the hard X-ray imaging system, which is composed of scintillator, fiber bundle and CCD camera, is experimentally obtained under different exposures. Experimental data agree with the model curve in tendency, that is, the maximal AD resolution increases with the growth of the exposure, while the minimum AD resolution decreases.
Keywords:imaging system  areal density  exposure  scintillator
本文献已被 万方数据 等数据库收录!
点击此处可从《强激光与粒子束》浏览原始摘要信息
点击此处可从《强激光与粒子束》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号