| 大功率二极管激光线阵的“smile”测量方法 |
| |
| 引用本文： | 郭林辉,唐淳,武德勇,高松信,雷军,蒋建锋,薄报学.大功率二极管激光线阵的“smile”测量方法[J].强激光与粒子束,2009,21(2). |
| |
| 作者姓名： | 郭林辉 唐淳 武德勇 高松信 雷军 蒋建锋 薄报学 |
| |
| 作者单位： | 1. 长春理工大学 高功率半导体激光国防重点实验室, 长春 130022；2. 中国工程物理研究院 应用电子学研究所, 四川 绵阳 621900 |
| |
| 基金项目： | 中国工程物理研究院基金 |
| |
| 摘 要： | 二极管激光线阵封装中产生的“smile”现象对激光器的激射特性、寿命、光束质量等都会产生较大的影响。采用高分辨率CCD、快轴准直透镜及柱面透镜组成的单轴放大系统对激光线阵发光单元成像及基于光斑强度求质心的算法实现了二极管激光线阵“smile”的测量。实验结果表明：在阈值电流附近，采用In焊料焊接的器件“smile”小于2 μm，讨论了快轴准直透镜、CCD等对实验结果的影响。
|
| 关 键 词： | 二极管激光 激光线阵 “smile”测量 质心算法 快轴准直透镜 |
| 收稿时间： | 1900-01-01; |
Measurement of "smile" for high-power diode laser array |
| |
| Guo Linhui,Tang Chun,Wu Deyong,Gao Songxin,Lei Jun,Jiang Jianfeng,Bo Baoxue.Measurement of "smile" for high-power diode laser array[J].High Power Laser and Particle Beams,2009,21(2). |
| |
| Authors: | Guo Linhui Tang Chun Wu Deyong Gao Songxin Lei Jun Jiang Jianfeng Bo Baoxue |
| |
| Institution: | 1. National Defence Laboratory of High Power Laser Diodes, Changchun University of Scienceand Technology， Changchun 130022， China; 2. Institute of Applied Electronics， CAEP，P.O. Box 919-1013， Mianyang 621900, China |
| |
| Abstract: | Diode laser array curvature “smile” produced in the packaging process affects the lasering characteristics, life and beam quality of lasers. Using uniaxial amplification system composed of a high-resolution CCD, a fast axis collimation lens and cylindrical lenses, via laser emitters imaging and facula intensity-based centroid algorithm, the “smile” of diode laser array is measured. The experimental results show that: in the vicinity of threshold current, “smile” of the diode laser array with In solder is less than 2 μm. Influences of FAC lens and CCD resolution on the results are analyzed. |
| |
| Keywords: | diode laser array “smile” measurement centroid algorithm fast axis collimation lens |
| 本文献已被 维普 万方数据 等数据库收录！ |
| 点击此处可从《强激光与粒子束》浏览原始摘要信息 |
| 点击此处可从《强激光与粒子束》下载免费的PDF全文 |
