首页 | 本学科首页   官方微博 | 高级检索  
     检索      

光学元件损伤在线检测图像处理技术
引用本文:冯博,刘炳国,陈凤东,刘国栋,彭志涛,元浩宇,孙和义.光学元件损伤在线检测图像处理技术[J].强激光与粒子束,2013,25(7):1697-1700.
作者姓名:冯博  刘炳国  陈凤东  刘国栋  彭志涛  元浩宇  孙和义
作者单位:1.哈尔滨工业大学 电气工程及自动化学院, 哈尔滨 1 50001 ;
摘    要:针对光学元件损伤图像中损伤区域的高精度检测问题,对内全反射照明下光学元件损伤图像的处理技术进行了研究。根据在线检测图像中损伤区域中心峰值的信号强度高于局部背景的信号强度这一特点,利用高斯滤波器生成待检测图像的局部信号强度比图像,实现了对损伤区域的低漏检率自动定位;根据CCD的成像原理,利用辐射标定的方法建立起损伤区域的尺寸与其在图像中总灰度的关系方程,实现了损伤区域的亚像素高精度尺寸测量。实验结果表明,与传统的光学元件损伤图像处理算法相比,本文提出的算法在保持低漏检率的同时大大提高了损伤区域的测量精度。

关 键 词:图像处理    局部信号强度比    辐射标定    全内反射照明
收稿时间:2012-09-02;

Images prgressing technology of optics damage online inspection
Feng Bo,Liu Bingguo,Chen Fengdong,Liu Guodong,Peng Zhitao,Yuan Haoyu,Sun Heyi.Images prgressing technology of optics damage online inspection[J].High Power Laser and Particle Beams,2013,25(7):1697-1700.
Authors:Feng Bo  Liu Bingguo  Chen Fengdong  Liu Guodong  Peng Zhitao  Yuan Haoyu  Sun Heyi
Institution:1.School of Electrical Engineering and Automation,Harbin Institute of Technology,Harbin 150001,China;2.Research Center of Laser Fusion,CAEP,Mianyang 621900,China
Abstract:Images progressing technology of optics damage pictures which were taken in total internal reflection edge illumination was studied in this paper. Signal intensity of defects is stronger than background’s intensity in the edge lit images. Based on this property, local signal intensity ratio image was produced by Gaussian filter to locate the defects with high accuracy. A calibration equation between the size of the defects and the gray value was built. The size of the defects could be precisely calculated using the calibration equation. A comparison test was carried out, the results indicate that the proposed algorithm is superior to the traditional ones on the precision.
Keywords:local signal intensity ratio  exposure calibration  total internal reflection edge illumination
点击此处可从《强激光与粒子束》浏览原始摘要信息
点击此处可从《强激光与粒子束》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号