| 狭缝法合肥光源高亮度注入器发射度测量系统 |
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| 引用本文： | 王晓辉,何志刚,方佳,孙葆根,贾启卡,唐雷雷,卢平,罗箐.狭缝法合肥光源高亮度注入器发射度测量系统[J].强激光与粒子束,2012,24(2):457-462. |
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| 作者姓名： | 王晓辉 何志刚 方佳 孙葆根 贾启卡 唐雷雷 卢平 罗箐 |
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| 作者单位： | 1.中国科学技术大学 核科学技术学院, 国家同步辐射实验室, 合肥 230029 |
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| 基金项目： | 国家985基金项目 (173123200402002)；国家自然科学基金项目(10875117，11175173) |
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| 摘 要： | 为了测量受空间电荷效应支配的发射度，合肥光源高亮度注入器采用了狭缝法进行测量，研究了基于狭缝法发射度测量系统的构成，并以实例比较了单狭缝和多狭缝在发射度测量系统中的应用。两种测量方法的结果表明:单狭缝法测量的结果更接近于模拟计算值，可有效避免子束团之间的重叠，适用范围更广。实验结果表明:在240 pC电荷量情况下，合肥光源高亮度注入器仍然具有较小的归一化发射度，为（1.840.085） mmmrad。
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| 关 键 词： | 高亮度注入器 发射度 相空间 子束团 狭缝 |
| 收稿时间： | 2011/5/31 |
Slit-based emittance measurement system for high-brightness injector at Hefei Light Source |
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| Wang Xiaohui
,
He Zhigang
,
Fang Jia
,
Sun Baogen
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Jia Qika
,
Tang Leilei
,
Lu Ping
,
Luo Qing.Slit-based emittance measurement system for high-brightness injector at Hefei Light Source[J].High Power Laser and Particle Beams,2012,24(2):457-462. |
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| Authors: | Wang Xiaohui He Zhigang Fang Jia Sun Baogen Jia Qika Tang Leilei Lu Ping Luo Qing |
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| Institution: | 1.National Synchrotron Radiation Laboratory,School of Nuclear Science and Technology,University of Science and Technology of China,Hefei 230029,China |
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| Abstract: | In order to measure the beam emittance which is space charge dominated, a slit-based emittance measurement system is applied in Hefei Light Source(HLS). Two types of slit masks are chosen: multi-slit one and single-slit one. Measurement results show that, single-slit based emittance measurement yields closer results to the simulation value. Moreover, single-slit based emittance measurement can avoid the overlapping between adjacent beamlets, which makes its application range wider than multi-slit technique. The experiment result shows that with the beam charge of 240 pC, normalized emittance of (1.84±0.085) mm·mrad can be achieved at HLS. |
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| Keywords: | high brightness injector emittance phase space beamlet slit |
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