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光学元件超声清洗工艺研究
引用本文:王刚,马平,邱服民,胡江川,鄢定尧.光学元件超声清洗工艺研究[J].强激光与粒子束,2012,24(7):1761-1764.
作者姓名:王刚  马平  邱服民  胡江川  鄢定尧
作者单位:1.成都精密光学工程研究中心, 成都 61 0041
基金项目:国家高技术发展计划项目
摘    要:系统开展了光学元件超声清洗工艺的实验研究。通过研究超声清洗剂、清洗温度等工艺参数的优化,找到了能够有效祛除元件表面无机污染物和有机污染物的较佳超声清洗工艺,且超声清洗没有对光学元件表面产生损伤,清洗后的光学元件接触角小于6,并不残留大于1 m的颗粒,超声清洗对光学元件表面污染物的祛除能力远胜于手工清洗。

关 键 词:超声清洗    接触角    粗糙度    原子力显微镜形貌    表面微观状况
收稿时间:2011/11/23

Optimization of ultrasonic cleaning of optics
Wang Gang , Ma Ping , Qiu Fumin , Hu Jiangchuan , Yan Dingyao.Optimization of ultrasonic cleaning of optics[J].High Power Laser and Particle Beams,2012,24(7):1761-1764.
Authors:Wang Gang  Ma Ping  Qiu Fumin  Hu Jiangchuan  Yan Dingyao
Institution:1.Chengdu Fine Optic Engineering Research Center,Chengdu 610041,China
Abstract:An experimental study on ultrasonic cleaning of optics was carried out. Optimization of the cleaning process was performed through comparative experiments with different cleaning reagents and temperatures. The optimized cleaning process removes both organic pollutants and inorganic pollutants effectively. After optimized cleaning, the optics surface shows no additional damage, with the contact angle less than 6°, and no pollutant particles larger than 1 μm left. Ultrasonic cleaning attains a better cleaning effect than manual cleaning.
Keywords:ultrasonic cleaning  contact angle  roughness  AFM contour  surface morphology
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