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磁控溅射制备Ni/Ti多层膜表面粗糙度
引用本文:潘磊,朱京涛,王晓强,蒋励,李浩川,徐敬,张众,王占山,陈玲燕.磁控溅射制备Ni/Ti多层膜表面粗糙度[J].强激光与粒子束,2010,22(6).
作者姓名:潘磊  朱京涛  王晓强  蒋励  李浩川  徐敬  张众  王占山  陈玲燕
作者单位:同济大学 精密光学工程技术研究所, 上海 200092
基金项目:国家自然科学基金,国家高技术研究发展计划(863计划),上海市委资助课题 
摘    要:采用磁控溅射方法制备了周期数分别为10,30,50和75的Ni/Ti多层膜,利用X射线掠入射反射测量了多层膜表面和界面的状态,并用原子力显微镜测量了多层膜的表面粗糙度,研究了不同周期数的Ni/Ti多层膜表面粗糙度的变化规律。结果表明:Ni/Ti多层膜表面粗糙度随着膜层数增加而增加,当Ni/Ti多层膜的周期数从10变化到75时,其表面粗糙度由0.80 nm增大到1.69 nm。实验数据拟合表明:Ni/Ti多层膜表面粗糙度与周期数成3次方关系;但在周期数较小时,粗糙度与周期数成线性关系。

关 键 词:中子超反射镜  粗糙度  原子力显微镜  X射线反射
收稿时间:1900-01-01;

Surface roughness of Ni/Ti multilayers made by magnetron sputtering
Pan Lei,Zhu Jingtao,Wang Xiaoqiang,Jiang Li,Li Haochuan,Xu Jing,Zhang Zhong,Wang Zhanshan,Chen Lingyan.Surface roughness of Ni/Ti multilayers made by magnetron sputtering[J].High Power Laser and Particle Beams,2010,22(6).
Authors:Pan Lei  Zhu Jingtao  Wang Xiaoqiang  Jiang Li  Li Haochuan  Xu Jing  Zhang Zhong  Wang Zhanshan  Chen Lingyan
Institution:Institute of Precision Optical Engineering, Tongji University, Shanghai 200092, China
Abstract:Nickel/titanium multilayers with different period of 10, 30, 50 and 75 were fabricated by DC magnetron sputtering. Grazing incidence X-ray measured reflectivity was used to characterize the interfacial roughness of the multilayers. To study the evolution law of surface roughness of Ni/Ti multilayers with different period numbers, atomic force microscope(AFM) was used to characterize the surfaces of the multilayers. The results show that surface roughness of Ni/Ti multilayers increases with the number of periods of the multilayers. As the number of periods increases from 10 to 75, the roughness increases from 0.8 nm to 1.69 nm. Fitting results show that surface roughness mainly varies with the number of periods as a cubic function.
Keywords:roughness  atomic force microscope  X-ray reflection
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