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数字全息形貌测量的基本特性分析
引用本文:刘诚,朱健强.数字全息形貌测量的基本特性分析[J].强激光与粒子束,2002,14(3):328-330.
作者姓名:刘诚  朱健强
作者单位:中国科学院 上海光学精密机械研究所,高功率激光物理国家实验室,上海 201800
基金项目:国家 8 63惯性约束聚变领域资助课题
摘    要: 在对数字全息技术进行严格理论分析的基础上,本文指出随单个CCD像元的尺寸的减小可能被记录物体的横向尺寸将变大,所允许的纵向尺寸却变小;另一方面其系统误差和被测量值本身的大小成正比,和横向分辨率成反比。

关 键 词:数字全息  误差分析  分辨率  形貌测量
文章编号:1001-4322(2002)03-0328-03
收稿时间:2001/10/27
修稿时间:2001年10月27

Basic characters of digital holographic profiling
LIU Cheng,ZHU Jian-qiang.Basic characters of digital holographic profiling[J].High Power Laser and Particle Beams,2002,14(3):328-330.
Authors:LIU Cheng  ZHU Jian-qiang
Institution:Shanghai Institute of Optics and fine mechanics, the Chinese Academy of Sciences, P.O.Box 800-211, Shanghai 201800,China
Abstract:Basic characters of digital holographic profiling including its system error, resolution, imaging depth, and the size limit of the recorded object are theoretically discussed in this paper. It is pointed out that the system error of digital holographic profiling is in proportion to the squared size of the CCD chip and in inverse proportion to the recording distance. This paper also pointed out that the resolution of digital holographic profiling and the maximum size of the recorded object are all proportional to the size of CCD chip and in iverse proportion to the recording distance, while its imaging depth increases with the recording distance.
Keywords:digital holography  system error  resolving power  profiling  
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