Photon tunneling and transmittance resonance through a multi-layer structure with a left-handed materialvspace2pt |
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| Authors: | He Ying Zhang Xi Yang Yan-Fang and Li Chun-Fang |
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| Institution: | Department of physics, Shanghai University, Shanghai 200444, China;Department of physics, Shanghai University, Shanghai 200444, China;Department of physics, Shanghai University, Shanghai 200444, China;Department of physics, Shanghai University, Shanghai 200444, China |
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| Abstract: | This paper investigates the photon tunneling and transmittance resonance through a multi-layer structure including a left-handed material(LHM). An analytical expression for the transmittance in a five-layer structure is given by the analytical transfer matrix method. The transmittance is studied as a function of the refractive index and the width of the LHM layer. The perfect photon tunneling results from the multi-layer structure, especially from the relation between the magnitude of the refractive index and the width of the LHM layer and those of the adjoining layers. Photons may tunnel through a much greater distance in this structure. Transmittance resonance happens, the peaks and valleys appear periodically at the resonance thickness. For an LHM with inherent losses, the perfect transmittance is suppressed. |
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| Keywords: | left-handed material photon tunneling transmittance resonance analytical transfer matrix method |
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