Energy band alignment at ferroelectric/electrode interface determined by photoelectron spectroscopy |
| |
| Authors: | Chen Feng Wu Wen-Bin Li Shun-Yi reas Klein |
| |
| Institution: | a High Magnetic Field Laboratory, Chinese Academy of Sciences (CAS), and Hefei National Laboratory for Physical Sciences at Microscale, University of Science and Technology of China, Hefei 230026, China;b TechnischeUniversitt Darmstadt, Department of Materials and Earth Sciences, Petersenstraße 32, D-64287 Darmstadt, Germany |
| |
| Abstract: | The most important interface-related quantities determined by band alignment are the barrier heights for charge transport, given by the Fermi level position at the interface. Taking Pb(Zr,Ti)O3(PZT) as a typical ferroelectric material and applying X-ray photoelectron spectroscopy(XPS), we briefly review the interface formation and barrier heights at the interfaces between PZT and electrodes made of various metals or conductive oxides. Polarization dependence of the Schottky barrier height at a ferroelectric/electrode interface is also directly observed using XPS. |
| |
| Keywords: | ferroelectric band alignment Schottky barrier X-ray photoelectron spectroscopy |
| 本文献已被 CNKI 维普 等数据库收录！ |
| 点击此处可从《中国物理 B》浏览原始摘要信息 |
| 点击此处可从《中国物理 B》下载免费的PDF全文 |
|
