Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China; Materials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
Abstract:
We report on a forest-like-to-desert-like pattern
evolution in the growth of an organic thin film observed by using an
atomic force microscope. We use a modified diffusion limited
aggregation model to simulate the growth process and are able to
reproduce the experimental patterns. The energy of electric dipole
interaction is calculated and determined to be the driving force for
the pattern formation and evolution. Based on these results, single
crystalline films are obtained by enhancing the electric dipole
interaction while limiting effects of other growth
parameters.