The detection of thin embedded layers using normal incidence ultrasound

A theoretical investigation of the use of normal incidence ultrasonic reflection measurements for the detection and characterization of thin layers embedded between two much thicker media has been carried out. It has been shown that the form of the relationship between the normal incidence longitudinal reflection coefficient and frequency is defined by the reflection coefficients at zero frequency and at half the resonance frequency of the layer. The reflection coefficient at zero frequency is solely a function of the impedances of the media on either side of the layer, while that at half the resonance frequency of the layer is a function of the impedances of all three media. In general, the sensitivity of the reflection coefficient to the presence of the layer increases as the product of frequency and layer thickness increases, the maximum sensitivity being at half the resonance frequency of the layer. Unfortunately, with thin layers, it is generally not practical to test at this frequency. However, the reflection coefficient curve can, in principle, be reconstructed from data measured at lower frequencies and the sensitivity of the reflection coefficient at lower frequencies to the characteristics of the layer can be predicted from the sensitivity at half the resonance frequency. The sensitivity is also critically dependent on the relative impedances of the three media and is generally greatest when the half spaces on either side of the layer have the same impedance. With favourable impedances, it is possible to detect layers whose thickness is a small fraction of the wavelength of the ultrasonic waves employed. However, with other combinations of impedances, the detection of much thicker layers is not possible.