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MSLM调制组件的电光性能
引用本文:梁振宪,侯洵.MSLM调制组件的电光性能[J].光子学报,1993,22(4):332-336.
作者姓名:梁振宪  侯洵
作者单位:中国科学院西安光学精密机械研究所,中国科学院西安光学精密机械研究所 710068 西安交通大学电气工程系,710068
摘    要:对设计并制作的MgF2+(ZrO2/SiO2)]膜系·LiNbO3·ITO/玻璃结构的MSLM用调制组件的综合电光性能进行了实验测定。结果表明,其反射半波电压VπR为1.2kV±0.1kV,反射率达99%,峰值次级电子发射系数为5.8。用其制作的光导址MSLM具有良好的功能与性能。

关 键 词:光调制  反射谱  次级电子发射  MSLM
收稿时间:1992-10-10

THE ELECTRICAL AND OPTIC PROPERTIES OF THE MODULATION ASSEMBLY USED IN MSLM
Liang Zhenxian,Hou XunXi'an Institute of Optics and Precision Mechanics,Academia Sinica,Xi'an.THE ELECTRICAL AND OPTIC PROPERTIES OF THE MODULATION ASSEMBLY USED IN MSLM[J].Acta Photonica Sinica,1993,22(4):332-336.
Authors:Liang Zhenxian  Hou XunXi'an Institute of Optics and Precision Mechanics  Academia Sinica  Xi'an
Institution:Liang Zhenxian,Hou XunXi'an Institute of Optics and Precision Mechanics,Academia Sinica,Xi'an 710068
Abstract:A designed and fabricated MgF2+(ZrO2/SiO2)] film · LiNbO3 plate·ITO film/glass window structure, which will be used in a microchannel spatial light modulator as a complete electro-optic modulation assembly, has been electrically and optically characterized. The experimental results indicate that the reflective half-wave voltage KπR is 1.2± 0.1kV, reflectivity is 99% (633nm) and the peak value of secondary electron emission spectroscopy reaches 5.8. The functional experiments of a prototype MSLM device built with it show that this assembly has good electrical and optic properties.
Keywords:Optic modulation  Reflection spectroscopy  Secondary electron emission
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