纳米云纹法条纹倍增技术研究

提出了一种纳米云纹法的条纹倍增技术，可用于单晶材料纳米级变形测量.在测量中，单晶材料的晶格结构由透射电镜（TEM）采集并记录在感光胶片上作为试件栅，几何光栅作为参考栅.对纳米云纹条纹的形成原理，透射电镜放大倍数与试件栅的频率关系，条纹倍增技术，位移、应变测量方法等进行了详细讨论.该方法不仅能够测量连续力学参量，如应变和位移，而且能够表征纳观非连续参量，如位错、夹杂.

A Study on the Multiplication Technique of Nano-moiré Fringe

A nano-moiré fringe multiplication method is proposed and used to measure nano-deformation of single crystal materials. The lattice structure of single crystal materials is captured by TEM (Transmission Electron Microscope) and acted as a specimen grating. An unidirectional grating fabricated on glass or film is selected as a reference grating. The formation principles of TEM nano-moiré fringe, the relationship between TEM magnification and grating frequency, as well as displacement and strain measurement method are discussed. A nano-moiré fringe pattern can be reproduced in a 4f optical filter system with a specimen grating and a prepared reference grating. By selecting the reference grating with specific frequency and utilizing different diffraction order, a multiplying moiré fringe pattern can be obtained. The results illustrate that this technique can be used to measure deformation in nano-scale. This method is especially useful in the measurement of inhomogeneous displacement field, and can be utilized to reveal nano-mechanical behavior such as dislocation and atomic bond failure.