介质层厚对含负折射率介质Bragg微腔的影响

研究了介质层厚对含负折射率介质一维光子晶体Bragg微腔的缺陷模和双稳态的影响.在中心频率附近将传输矩阵各矩阵元采用泰勒级数展开并取一级近似,得到了缺陷模频率与介质层厚的关系式及品质因子公式.研究结果表明：一级近似法能很好地解释中心频率附近介质层厚对缺陷模频率的影响.理想Bragg微腔结构的缺陷模品质因子最大；递增正折射率介质层厚和增大缺陷层介质层厚、递减负折射率介质层厚及同时等量递减正和负折射率介质层厚,均可使缺陷模红移,双稳态阈值降低.

Influence of Medium Layer Thicknesses on Bragg Microcavity Containing Negative Refractive Index Materials

The influence of medium layer thickness on defect mode and bistability properties in the Bragg microcavity composed of 1D photonic crystal containing negative refractive index materials is studied.The transfer matrix is expanded in Taylor Series near the central frequency.Then the formulae of defect mode frequency,and the quality factor are obtained with the first order approximation.The influence of medium layer thickness on defect mode frequency near the central frequency can be well explained with the method of the first order approximation.The quality factor of the defect mode in the ideal Bragg microcavity structure is the largest.The defect mode is shifted in the direction of low frequency and bistable threshold can be reduced by increasing by degrees thickness of right handed materials and increasing thickness of defect layer material or reducing by degrees thickness of left handed materials and synchronously reducing equal layer thickness of right and left handed materials.