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电子显微镜散斑照相技术
引用本文:刘战伟,吴宁宁,谢惠民,戴福隆.电子显微镜散斑照相技术[J].光子学报,2009,38(1):64-68.
作者姓名:刘战伟  吴宁宁  谢惠民  戴福隆
作者单位:1. 北京理工大学,理学院力学系,北京,100081
2. 清华大学,航空航天学院力学系,北京,100084
基金项目:国家基础研究基金,国家自然科学基金 
摘    要:提出了一种新颖的人工亚微米/纳米散斑制作技术.采用超声波分散亚微米/纳米颗粒,然后利用范德华力、静电力和毛细力将其吸附在试件表面.在特定分辨率的扫描电镜下,物体表面的亚微米/纳米颗粒可以看作是亚微米/纳米散斑.此外,发展了一种测量面内亚微米/纳米级变形的电子显微镜散斑照相技术.详细介绍了人工制作亚微米/纳米散斑和电子显微镜散斑照相技术,实验验证了技术的可行性

关 键 词:实验力学  电子显微镜散斑照相技术  亚微米/纳米散斑  超声波分散技术
收稿时间:2007-06-26
修稿时间:2007-10-26

Electron Microscope Speckle Photography Technique
LIU Zhan-wei,WU Ning-ning,XIE Hui-min,DAI Fu-long.Electron Microscope Speckle Photography Technique[J].Acta Photonica Sinica,2009,38(1):64-68.
Authors:LIU Zhan-wei  WU Ning-ning  XIE Hui-min  DAI Fu-long
Institution:1 Department of Mechanics;School of Science;Beijing Institute of Technology;Beijing 100081;China;2 FML;Department of Engineering Mechanics;Tsinghua University;Beijing 100084;China
Abstract:A novel artificial sub-micron or nanometer speckle fabricating technique was proposed by taking advantage of sub-micron or nanometer particles.In the technique,sub-micron or nanometer particles were adhered to an object surface by using ultrasonic dispersing technique.The particles on the object surface can be regarded as sub-micron or nanometer speckle by using a Scanning Electronic Microscope (SEM) at a special magnification.And,an Electron Microscope Speckle Photography (EMSP) method was developed to measure in-plane submicron or nanometer deformation of the object coated with the artificial sub-micron or nanometer speckles.The principle of artificial sub-micron or nanometer speckle fabricating technique and the EMSP method were discussed in detail.The experimental results verified that the artificial sub-micron or nanometer speckle fabricating technique and EMSP method is feasible.
Keywords:Experimental mechanics  Electron microscope speckle photography  Sub-micron or nanometer speckle  Ultrasonic dispersing technique
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