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First results of the application of scanning XRF analysis with synchrotron-radiation beams from the VEPP-3 to study the spatial distribution of trace elements in samples of stratiform chromite ores |
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| Authors: | A V Darin I V Veksler Ya V Rakshun |
| Institution: | 1.Sobolev Institute of Geology and Mineralogy,Siberian Branch, Russian Academy of Sciences,Novosibirsk,Russia;2.Perm State National Research University,Perm,Russia;3.Department of Mineralogy and Petrology,Technical University Berlin,Berlin,Germany;4.Budker Institute of Nuclear Physics,Siberian Branch, Russian Academy of Sciences,Novosibirsk,Russia |
| Abstract: | A sample from chromite horizon UG1 of the platiniferous Bushveld complex (South Africa) is studied by scanning X-ray fluorescence (XRF) microanalysis using synchrotron-radiation beams from the VEPP-3 storage ring. The sample contains plagioclase and chromite layers 3–5 mm in thickness. The experimental study is conducted at excitation energies of 15 and 30 keV; the spot size of the excitation radiation is 0.1 ± 2 mm; and the scanning step is 100 µm. The distribution profiles of more than 20 trace elements over the surface of the sample are obtained. |
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