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Total dose radiation effects on SOI NMOS transistors with different layouts |
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| Authors: | TIAN Hao ZHANG Zheng-Xuan HE Wei YU Wen-Jie WANG Ru CHEN Ming |
| Institution: | [1]Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China [2]Graduate University of Chinese Academy of Sciences, Beijing 100049, China |
| Abstract: | |
| Keywords: | SIMOX SOI total dose radiation effect MOS transistors |
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