A digital CDS technique and its performance testing |
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作者姓名: | 刘晓艳 陆景彬 杨彦佶 陆波 王于仨 徐玉朋 崔苇苇 李炜 李茂顺 王娟 韩大炜 陈田祥 霍嘉 胡渭 张艺 朱玥 张子良 尹国和 王宇 赵仲毅 付艳红 张娅 马克岩 陈勇 |
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作者单位: | 1 College of Physics, Jilin University, No.2699, Qianjin Road, Changchun 130023, China;;2 Key Laboratory of Particle Astrophysics, Institute of High Energy Physics, Chinese Academy of Sciences, 19B Yuquan Road, Beijing 100049, China;;3 School of Physical Science and Technology, Yunnan University, Cuihu North Road 2, Kunming 650091, China |
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摘 要: | Readout noise is a critical parameter for characterizing the performance of charge-coupled devices (CCDs), which can be greatly reduced by the correlated double sampling (CDS) circuit. However, a conventional CDS circuit inevitably introduces new noise since it consists of several active analog components such as operational amplifiers. This paper proposes a digital CDS circuit technique, which transforms the pre-amplified CCD signal into a train of digital presentations by a high-speed data acquisition card directly without the noisy CDS circuit, then implements the digital CDS algorithm through a numerical method. A readout noise of 3.3 e- and an energy resolution of 121 eV@5.9 keV can be achieved via the digital CDS technique.
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关 键 词: | charge-coupled devices readout noise correlated double sampling |
收稿时间: | 2014-10-10 |
修稿时间: | 2014-11-21 |
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