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TEMAS: A Flexible Non-AI Algorithm for Metrology of Single-Core and Core-Shell Nanoparticles from TEM Images
Authors:Jorge J Sáenz Noval  Rubén Gómez-Merchán  Juan A Leñero-Bardallo  Lionel C Gontard
Institution:1. Department of Condensed Matter Physics, Applied Magnetism and Optics Research Group, University of Cádiz, 11510 Puerto Real, Spain

IMEYMAT, University of Cádiz, 11510 Puerto Real, Spain;2. Institute of Microelectronics of Seville (IMSE-CNM), CSIC-Universidad de Sevilla, 41092 Sevilla, Spain;3. Department of Condensed Matter Physics, Applied Magnetism and Optics Research Group, University of Cádiz, 11510 Puerto Real, Spain

Abstract:
Keywords:electron microscopy  nanometrology  nanoparticles  transmission electron microscopy  template matching
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