Configuration of pentacene (C22H14) films on Si(1 0 0)-2 × 1 studied by NEXAFS |
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Authors: | Han-Koo Lee Ki-jeong Kim Tai-Hee Kang |
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Institution: | a Department of Physics, Pohang University of Science and Technology (POSTECH), San 31, Hyojadong, Namgu, Pohang, Kyung-Buk, Republic of Korea b Pohang Accelerator Laboratory, San 31, Hyojadong, Namgu, Pohang, Kyung-Buk, Republic of Korea c Department of Chemistry and School of Molecular Science (BK21), Korea Advanced Institute of Science and Technology, Daejeon 305-701, Republic of Korea |
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Abstract: | Pentacene films on Si(1 0 0)-(2 × 1) surface at 300 K were investigated using near edge X-ray absorption fine structure (NEXAFS) at the carbon K-edge. NEXAFS spectra show that pentacene molecules are chemisorbed on the Si(1 0 0)-(2 × 1) surface for monolayer with flat-laying and predominantly physisorbed on the Si(1 0 0)-(2 × 1) surface for multilayer films with an upright molecular orientation. Absorption angle of pentacene molecules were measured through π∗ transition. The angles between the double bond and the silicon surface were 35-55°, 65° and 76° at monolayer, 24 and 48 nm pentacene deposited on the Si(1 0 0) surface, respectively. We observed that the intermediate flat-laying phase is favored for monolayer coverage, while the films of molecules standing perpendicular to the Si(1 0 0) surface are favored for multilayer coverage. |
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Keywords: | Pentacene NEXAFS Si(1 0 0) Molecular orientation Thin-film transistor Organic-molecules |
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