Model two-dimensional diffraction profiles from disordered vicinal surfaces and random island configurations |
| |
| Authors: | J Kleiner CE Aumann Y-W Mo R Kariotis MG Lagally |
| |
| Institution: | Department of Materials Science and Engineering, University of Wisconsin, Madison, WI 53706, USA |
| |
| Abstract: | Methods for calculating model diffraction profiles of vicinal surfaces and distributions of islands are described. Modeling of rough terrace edges, and of island structures on terraces, has been performed using phenomenological Hamiltonians. The methods are developed for calculating diffraction profiles in all components, sx, sz, and sy, of the momentum transfer. It is s of step structure irregularities is related to profile shape. Qualitative comparison with experiment is made based on the observed characteristics of terraces obtained from STM and LEED data of vicinal Si(OO1). |
| |
| Keywords: | |
| 本文献已被 ScienceDirect 等数据库收录！ |
|
