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Surface structure of In/Si(1 1 1) studied by reflection high-energy positron diffraction
Authors:M Hashimoto  Y Fukaya  A Ichimiya
Institution:a Advanced Science Research Center, Japan Atomic Energy Agency, 1233 Watanuki, Takasaki, Gunma 370-1292, Japan
b Faculty of Science, Japan Women’s University, 2-8-1 Mejirodai, Bunkyo-ku, Tokyo 112-8681, Japan
Abstract:We have investigated a quasi-one-dimensional structure of In/Si(1 1 1) surface using reflection high-energy positron diffraction (RHEPD), which is sensitive to the topmost surface structure under the total reflection condition. From the rocking curves, we found that In atoms are located at two different vertical positions, i.e., 0.99 Å and 0.55 Å from the Si zigzag chain in both 4 × 1 (210 K) and 8 × 2 (60 K) phases.
Keywords:Surface structure  Reflection high-energy positron diffraction  Total reflection  Silicon  Indium
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