Comparative LEED and RHEED examination of stepped surfaces; Application to Cu(111) and GaAs(100) vicinal surfaces |
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| Authors: | F Hottier JB Theeten A Masson JL Domange |
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| Institution: | Laboratoires d''Electronique et de Physique Appliquée, 3, avenue Descartes, BP15, 94450 Limeil-Brévannes, France;ENSCP, 11, rue P. et M. Curie, 75005 Paris, France |
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| Abstract: | Vicinal surfaces of copper and gallium arsenide samples are examined with LEED and RHEED techniques. The assessments obtained by the two techniques are compared and a significant advantage of RHEED is demonstrated. |
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