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Characteristics of polymer velvet as field emitters under high-current pulsed discharge
Authors:Limin Li  Lie Liu  Hong Wan  Yonggui Liu
Institution:a College of Photoelectric Science and Engineering, National University of Defense Technology, Changsha 410073, People's Republic of China
b Department of Material Engineering and Applied Chemistry, National University of Defense Technology, Changsha 410073, People's Republic of China
Abstract:In this paper we investigated the surface morphology and emission property of polymer velvet in a cathode test system powered by a ∼400 ns, ∼400 kV pulsed generator. After a series of pulse shots, the velvet surface exhibited an obvious decrease in the amount of emitters, namely, the smoothing of microprotrusions, indicating a lower field enhancement factor or a higher turn-on electric field than that for no shots. As the velvet cathode lifetime proceeded, the beam degradation was observed in terms of the voltage pulse length, maximum emission current, and rise time of diode current. Further, the average current density significantly decreased during a 100 pulse shot test, from 280 to 160 A/cm2. The surface discharge caused many plasma spots on the velvet surface. The cathode plasma expands towards the anode, directly leading to the diode gap closure. The degradation in the velvet performance after high-current emission may be related to this behavior of cathode plasma. Finally, the electron emission mechanisms, how to affect the surface morphology of velvet, are presented.
Keywords:Polymer velvet  Emission property  Surface morphology  Pulsed discharge
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