首页 | 本学科首页   官方微博 | 高级检索  
     检索      


MOCVD of zirconium oxide thin films: Synthesis and characterization
Authors:AM Torres-Huerta  MA Domínguez-Crespo  JR Vargas-García
Institution:a Centro de Investigación en Ciencia Aplicada y Tecnología Avanzada, Unidad Altamira, Instituto Politécnico Nacional, Km. 14.5 Carr. Tampico-Puerto Industrial, C.P. 89600, Altamira, Tamaulipas, Mexico
b ESIQIE, Departamento de Metalurgia y Materiales, Instituto Politécnico Nacional. A.P. 75-876, 07300 México, D.F., Mexico
Abstract:The synthesis of thin films of zirconia often produces tetragonal or cubic phases, which are stable at high temperatures, but that can be transformed into the monoclinic form by cooling. In the present study, we report the deposition of thin zirconium dioxide films by metalorganic chemical vapor deposition using zirconium (IV)-acetylacetonate as precursor. Colorless, porous, homogeneous and well adherent ZrO2 thin films in the cubic phase were obtained within the temperature range going from 873 to 973 K. The deposits presented a preferential orientation towards the (1 1 1) and (2 2 0) planes as the substrate temperature was increased, and a crystal size ranging between 20 and 25 nm. The kinetics is believed to result from film growth involving the deposition and aggregation of nanosized primary particles produced during the CVD process. A mismatch between the experimental results obtained here and the thermodynamic prediction was found, which can be associated with the intrinsic nature of the nanostructured materials, which present a high density of interfaces.
Keywords:ZrO2  CVD  Thin films
本文献已被 ScienceDirect 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号