Application of positron beams to the study of positronium-forming solids |
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Authors: | Y Kobayashi R Suzuki T Ohdaira |
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Institution: | National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8565 and 8568, Japan |
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Abstract: | Doppler broadening of annihilation radiation (DBAR) and positron annihilation lifetime spectroscopy (PALS) have been successfully applied to the study of positronium (Ps)—forming amorphous solids such as polymers and silicon oxide in the bulk. Implementing depth selectivity to DBAR and PALS by combining them with variable-energy positron beams considerably broadens their applicability. Variation of incident positron energy over a wide range enables depth-profiling, whereas tuning of the beam energy enables the studies of surfaces, interfaces and thin films. In this paper, we discuss fundamentals and applications of energy variable DBAR and PALS for Ps—forming polymers and silicon oxide. |
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Keywords: | Positronium Positron beam Lifetime Annihilation radiation Defect Free volume Polymer Silicon oxide |
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