| 钢中残量元素As,Sn,Sb的X射线荧光光谱分析 |
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| 引用本文： | 朱见英,沈炜.钢中残量元素As,Sn,Sb的X射线荧光光谱分析[J].光谱实验室,1993,10(5):50-51,28. |
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| 作者姓名： | 朱见英 沈炜 |
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| 作者单位： | 上海大型铸锻件研究所，上海大型铸锻件研究所，上海大型铸锻件研究所 上海市闵行东吴泾，200240，上海市闵行东吴泾，200240，上海市闵行东吴泾，200240 |
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| 摘 要： | 本文介绍了用日本理学3530XRF光谱仪扫描道测定钢中痕量元素As、Sn、Sb。由于短波强大的背景破坏了检测线的线性,通过用DATAFLEX 181B背景扣除的数据处理,消除了这些影响,成功地校准了曲线。方法简单;快速;XRFS结果与化学分析一致,该法已用于炼钢的过程控制和原材料分析。
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| 关 键 词： | 钢 砷 锡 锑 X射线 荧光光谱分析 |
The Analysis of Residual Elements As,Sn,Sb in Steel by XRFS |
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| Zhu Jianying Shanghai Heavy Forging and Casting Research Institute,Dongwujing Minhang,Shanghai ,P. R. ChinaShen Wei Shanghai Heavy Forging and Casting Research Institute,Dongwujing Minhang,Shanghai ,P. R. ChinaChen Guoxing Shanghai Heavy Forging and Casting Research Institute,Dongwujing Minhang,Shanghai ,P. R. China.The Analysis of Residual Elements As,Sn,Sb in Steel by XRFS[J].Chinese Journal of Spectroscopy Laboratory,1993,10(5):50-51,28. |
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| Authors: | Zhu Jianying Shanghai Heavy Forging and Casting Research Institute Dongwujing Minhang Shanghai P R ChinaShen Wei Shanghai Heavy Forging and Casting Research Institute Dongwujing Minhang Shanghai P R ChinaChen Guoxing Shanghai Heavy Forging and Casting Research Institute Dongwujing Minhang Shanghai P R China |
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| Institution: | Zhu Jianying Shanghai Heavy Forging and Casting Research Institute,Dongwujing Minhang,Shanghai 200240,P. R. ChinaShen Wei Shanghai Heavy Forging and Casting Research Institute,Dongwujing Minhang,Shanghai 200240,P. R. ChinaChen Guoxing Shanghai Heavy Forging and Casting Research Institute,Dongwujing Minhang,Shanghai 200240,P. R. China |
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| Abstract: | This paper describes a method for determination of trace elements As, Sn, Sb in steel by scan channel of Rigaku 3530 XRF spectrometer. The linearity of the analytical calibration curve is disturbed by the strong spectra background. The in terference has been resolved by means of data process of background subtraction with DATAFLEX 181B and the curves were corrected successfully. The method is simple, rapid and the results of XRFS are coincident with that of chemical analysis. Now the method has been adopted as a process control in making steel and raw ma- terial analysis. |
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| Keywords: | Scan Channel XRF Spectrometer Background Subtraction XRFS Analysis |
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