MULTIPLE IONIZATION PROCESS STUDIED WITH COINCIDENCE TECHNIQUE BETWEEN SLOW RECOIL IOH AND PROJECTILE ION IN 42 MeV Ar~(q )-Ar COLLISIONS |
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作者姓名: | T.Tonuma H.Kumagai T.Matsuo H.Tawara |
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作者单位: | RIKEN,Wako-shi,Saitama 351-01 Japan,RIKEN,Wako-shi,Saitama 351-01 Japan,Tokyo Medical and Dental University,Tokyo 113 Japan,National Institute for Fusion Science,Nagoya 464-01 Japan |
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摘 要: | Slow Ar recoil ion production cross sections by 42MeV Ar~(q )(q=4-14)projectiles were measured using a projectile ion-recoilion coincidence technique in order to provide information onmechanisms of multiple ionization of target atoms through pureionization as well as of that accompanied simultaneously with mul-tiple electron loss or capture of projectiles. The present resultssuggest that inner-shell electron processes caused through electrontransfer into projectiles and also electron ionization by projectilesplay a key role in the production of multiply charged recoil ions.
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