首页 | 本学科首页   官方微博 | 高级检索  
     检索      

MULTIPLE IONIZATION PROCESS STUDIED WITH COINCIDENCE TECHNIQUE BETWEEN SLOW RECOIL IOH AND PROJECTILE ION IN 42 MeV Ar~(q )-Ar COLLISIONS
作者姓名:T.Tonuma  H.Kumagai  T.Matsuo  H.Tawara
作者单位:RIKEN,Wako-shi,Saitama 351-01 Japan,RIKEN,Wako-shi,Saitama 351-01 Japan,Tokyo Medical and Dental University,Tokyo 113 Japan,National Institute for Fusion Science,Nagoya 464-01 Japan
摘    要:Slow Ar recoil ion production cross sections by 42MeV Ar~(q )(q=4-14)projectiles were measured using a projectile ion-recoilion coincidence technique in order to provide information onmechanisms of multiple ionization of target atoms through pureionization as well as of that accompanied simultaneously with mul-tiple electron loss or capture of projectiles. The present resultssuggest that inner-shell electron processes caused through electrontransfer into projectiles and also electron ionization by projectilesplay a key role in the production of multiply charged recoil ions.

本文献已被 CNKI 等数据库收录!
点击此处可从《原子与分子物理学报》浏览原始摘要信息
点击此处可从《原子与分子物理学报》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号