|
|||||
|
|
Structural characterization of La0.9Ba0.1MnO3/Y-ZrO2 film by X-ray diffraction |
|
| Authors: | WS Tan HO WangP Dai HP WuXS Wu QJ JiaGJ Hu J Gao |
| Institution: | a Key Laboratory of Soft Chemistry and Functional Materials, Ministry of Education, Department of Applied Physics, Nanjing University of Science and Technology, Nanjing 210094, China b National Key Laboratory of Solid State Microstructures, Department of Physics, Nanjing University, Nanjing 210093, China c Institute of High Energy Physics, The Chinese Academy of Sciences, Beijing 100039, China d National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China e Department of Physics, The University of Hong Kong, Hong Kong, China |
| Abstract: | Perovskite manganite La0.9Ba0.1MnO3(LBMO) films were deposited on (0 0 1)-oriented single crystal yttria-stabilized zirconia (YSZ) substrate by 90° off-axis radio frequency magnetron sputtering. The film thickness ranged from 10 nm to 100 nm. Grazing incidence X-ray diffraction technique and high resolution X-ray diffraction were applied to characterize the structure of LBMO films. The LBMO film mainly consisted of (0 0 1)-orientated grain as well as weakly textured (1 1 0)-orientated grain. The results indicated that an amorphous layer with thickness of about 4 nm was formed at the LBMO/YSZ interface. The strain in LBMO film was small and averaged to be about -0.14%. The strain in the film was not lattice mismatch-induced strain but residual strain due to the difference in thermal expansion coefficient between film and substrate. |
| Keywords: | La0 9Ba0 1MnO3 film Grazing incidence X-ray diffraction Strain relaxation Structural characterization |
| 本文献已被 ScienceDirect 等数据库收录！ | |